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Chapter 4
Specifications
All specifications are subject to change without notice.
Typical for 25 °C unless otherwise specified.
Specifications in italic text are guaranteed by design.
Analog input
Table 1. AI specifications
Parameter
Conditions
Specification
A/D converters
16-bit, SAR type
Number of channels
16 single-ended
Input configuration
Individual A/D per channel
Sampling method
Simultaneous
Absolute maximum input
voltage
CHx IN to GND
±15 V max
Input impedance
100 M, min
Input bandwidth (3 dB)
50 kHz typ
Input leakage current
±1 µA typ
Input capacitance
50 pf typ
Offset temperature drift
15 ppm/°C typ
Gain temperature drift
All ranges
35 ppm/°C typ
Input ranges
Software selectable
±10 V, ±5 V, ±2 V, ±1 V
Sampling rate
Scan to PC memory
0.6 S/s to 50 kS/s, software programmable
Burst scan to 32 k
sample FIFO
20 S/s to 50 kS/s, software programmable
Throughput
Software paced
30 S/s to 500 S/s all channels; throughput is system
dependant)
Scan to PC memory
Refer to the Single Board Throughput and Multiple Board
Throughput sections that follow this table.
Burst scan to 32 k
sample FIFO
= (200 kS/s) / (# of channels), max of 50 kS/s for any channel
Gain queue
Software configurable. Sixteen elements, one gain element per
channel.
Resolution
16 bits
No missing codes
15 bits
Crosstalk
DC 25 kHz (sine)
80 dB min
Calibration voltages
0 V, ±0.625 V, ±1.25 V, ±2.5 V, ±5.0 V, software selectable
Calibration voltage
accuracy (Note 1)
±0.5% typ, ±1.0% max
Temperature sensor range
0 °C to +70 °C max
Temperature sensor
accuracy
±3 °C typ
Trigger source
Software selectable
External digital: TRIG_IN
Note 1: Actual values used for calibration are measured and stored in EEPROM.
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